The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2008
Filed:
Mar. 31, 2004
Michael Paul Robinson, Redmond, WA (US);
Peter Gerber, Sammamish, WA (US);
Michael Paul Robinson, Redmond, WA (US);
Peter Gerber, Sammamish, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
Smart test attributes are objects that are arranged to incorporate attributes functionality in the attributes themselves and to provide a standard way to interact with the attributes through a set of interfaces. The set of interfaces includes interfaces for class level attributes, method level attributes, and parameter level attributes. Test class attributes can be used to modify an instantiated object state, skip test extraction from a class, or cause test extraction to be performed multiple times for a denoted type. Method level attributes are capable of modifying method parameters and method execution. In an embodiment, method level attributes include execution attributes and supplemental attributes. Parameter level attributes are optionally used to modify the parameter input to a method and/or to modify a state of an object (e.g., the context) after a method has executed.