The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2008

Filed:

Apr. 30, 2003
Applicants:

James Francis Mcelwee, Austin, TX (US);

Eric Kimball, Austin, TX (US);

John James Paulos, Austin, TX (US);

Magesh Valliappan, Austin, TX (US);

Inventors:

James Francis McElwee, Austin, TX (US);

Eric Kimball, Austin, TX (US);

John James Paulos, Austin, TX (US);

Magesh Valliappan, Austin, TX (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/3167 (2006.01); G01R 31/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

GBit/s transceiver with built-in self test features. A method is disclosed for testing the operation of a transceiver having a digital processing section and an analog section, each having a transmit portion and a receive portion, the analog portions adaptable to interface with an analog network. The transceiver is first configured to operate in a test mode. In the test mode, the transmit portion of the digital processing section is activated to generate data to be transmitted by the transmit portion of the analog section. The receive portion of the analog section and the receive portion of the digital processing section are operated to receive data. Thereafter, the parametrics of select portions of the receive portion of the digital processing section are examined during the receipt of data by the receive portion of the analog section and processing thereof by the receive portion of the digital processing section.


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