The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2008

Filed:

Jun. 17, 2004
Applicants:

David Bigagli, Toronto, CA;

Xiaohui Wei, Chang Chun, CN;

Inventors:

David Bigagli, Toronto, CA;

Xiaohui Wei, Chang Chun, CN;

Assignee:

Platform Computing Corporation, Markham, Ontario, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system for performing autonomic monitoring in a computing grid is described. The system includes a plurality of modules, which when implemented into a computing grid, are operable to analyze objects of the grid and identify exception conditions associated with the objects. The system includes a configuration module for receiving information on specified objects to be monitored and exception conditions for the objects, an information collection module to collect job execution data associated with the objects, and an exception module to evaluate the job execution data associated with the objects and identify existing exception conditions. Related methods of performing autonomic monitoring in a grid system are also described.


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