The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2008

Filed:

Sep. 18, 2003
Applicants:

Mani Soma, Seattle, WA (US);

Welela Haileselassie, Poughkeepsie, NY (US);

Jessica Yan, Bothell, WA (US);

Inventors:

Mani Soma, Seattle, WA (US);

Welela Haileselassie, Poughkeepsie, NY (US);

Jessica Yan, Bothell, WA (US);

Assignee:

University of Washington, Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03F 1/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

Embodiments of the present invention apply wavelets to radio frequency (RF) signals to extract specific characteristics (e.g., jitter, phase variations, frequency variations) so that their timing, phase, and frequency components can be characterized. In one embodiment of the present invention, a Haar wavelet is used to extract timing characteristics. In another embodiment, a Morlet wavelet is used to extract phase characteristics. In still another embodiment, a Morlet wavelet is used to extract frequency characteristics.


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Soma, Mani. (2008). Characterization of radio frequency (rf) signals using wavelet-based parameter extraction (U.S. Patent No. 7340381). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7340381

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