The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2008

Filed:

Jul. 28, 2004
Applicant:

Axel Wenzler, Leonberg, DE;

Inventor:

Axel Wenzler, Leonberg, DE;

Assignee:

Robert Bosch GmbH, Stuttgart, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01); G01L 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to a method and a circuit arrangement for evaluating phase signals for determining an angle or a path of a linearly or rotationally displaced component, whereby a number (N) of measured phase values (), produced by scanning at least one phase sensor arrangement on the linearly or rotatably displaced component by means of an assigned sensor, are evaluated. According to the invention, once the measured phase values (α) have been transformed with a matrix (), a quality level (R) is determined by producing a vector (T) followed by the result of a quantization operation () regarding the vector (). Once a transformation has been carried out with a further matrix (), a further vector () is produced from the difference () between the vector () and the result of the quantization operation (), coefficients (C) and (D) being applied to the components (x) of said other vector, and the quality level (R) is derived therefrom.


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