The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2008
Filed:
Jan. 10, 2005
Dinesh Nair, Austin, TX (US);
Matthew S. Fisher, Austin, TX (US);
Satish V. Kumar, Austin, TX (US);
Bruce Smyth, Hollis, NH (US);
Subramanian Ramamoorthy, Austin, TX (US);
Dinesh Nair, Austin, TX (US);
Matthew S. Fisher, Austin, TX (US);
Satish V. Kumar, Austin, TX (US);
Bruce Smyth, Hollis, NH (US);
Subramanian Ramamoorthy, Austin, TX (US);
National Instruments Corporation, Austin, TX (US);
Abstract
A geometric pattern matching method to locate instances of a template image in a target image using a plurality of models with different feature combinations. A learning phase involves learning geometric information about the template image and creating a model for each of a plurality of different respective parent features. Each model comprises a relationship tree from the respective parent feature to one or more other child features, and hence each model may have different feature combinations. In a matching phase, the method may examine a plurality of different models to determine matches in the target image being analyzed. The matching phase may select different models dynamically based on prior matching results.