The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2008
Filed:
Sep. 03, 2003
Soon Wei Wong, Pandan Valley, SG;
Victor Vertoprakhov, Wing Fong Mansion, SG;
Wensen Zhou, Singapore, SG;
Ashedah Binti Jusoh Noor, Singapore, SG;
Tian Poh Yew, Singapore, SG;
Kundapura Parameshwara Srinivas, Singapore, SG;
Soon Wei Wong, Pandan Valley, SG;
Victor Vertoprakhov, Wing Fong Mansion, SG;
WenSen Zhou, Singapore, SG;
Ashedah Binti Jusoh Noor, Singapore, SG;
Tian Poh Yew, Singapore, SG;
Kundapura Parameshwara Srinivas, Singapore, SG;
Microview Technologies Pte Ltd., Singapore, SG;
Abstract
An inspection system is provided. The system includes a rotating prism having a first end and a second end. The first end receives a first image area, such as a circular view, and rotates about a center point so as to cover a field of view area that is larger than the first image area, such as a larger circle that is defined by the smaller circle of view as it rotates around the center point. The second end remains centered on the center point and provides a viewing area that does not change in dimension. An image data system at the second end of the rotating prism generates image data as the prism rotates so as to generate two or more sets of image data that are contained within the field of view area.