The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2008
Filed:
Sep. 16, 2005
Martin Versen, Feldkirchen-Westerham, DE;
Klaus Nierle, Essex Junction, VT (US);
Oliver Kiehl, Charlotte, VT (US);
Ernst Stahl, Essex Junction, VT (US);
Martin Versen, Feldkirchen-Westerham, DE;
Klaus Nierle, Essex Junction, VT (US);
Oliver Kiehl, Charlotte, VT (US);
Ernst Stahl, Essex Junction, VT (US);
Infineon Technologies AG, , DE;
Abstract
A method of testing internal signals of a memory for timing marginalities which may result in unstable operation includes: delaying internal address signals of the memory by an amount great enough so that data cannot be validly written to and read from memory locations which are accessed by address signals having timing marginalities which are delayed but small enough so that data can be validly written to and read from memory locations which are accessed by address signals not having such timing marginalities which are delayed. Data is then written to and read from memory locations which are accessed by delayed address signals, and a determination is made as to whether the data read from any memory location does not correspond with the data written to such memory location.