The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2008

Filed:

Jun. 19, 2003
Applicants:

Lalit K. Mestha, Fairport, NY (US);

Norman W. Zeck, Webster, NY (US);

Kenneth J. Mihalyov, Webster, NY (US);

Gaurav Sharma, Webster, NY (US);

Inventors:

Lalit K. Mestha, Fairport, NY (US);

Norman W. Zeck, Webster, NY (US);

Kenneth J. Mihalyov, Webster, NY (US);

Gaurav Sharma, Webster, NY (US);

Assignee:

Xerox Corporation, Norwalk, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 1/50 (2006.01); H04N 1/56 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention implements a CMYK to CMYK pre-transform in front of at least one printer to be clustered where the transform is designed to ensure that the printers addressed through the pre-transform have substantially identical output color for substantially identical input CMYK values. As one form of implementation a method is disclosed to build CMY to CMY 3D-LUTs and 1D-LUT for K using sensors in the field. Making use of a system LUT—CMY to CMY 3D-LUT and a K to K 1D-LUT—improves consistency and provides a coherent control strategy and a means to provide standardized input CMY and K values in a clustered environment so that single or multiple vendor DFEs see substantially identical CMYK values.


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