The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2008
Filed:
Jun. 07, 2005
Applicant:
Hong Peng, Fremont, CA (US);
Inventor:
Hong Peng, Fremont, CA (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 21/01 (2006.01);
U.S. Cl.
CPC ...
Abstract
An apparatus and method for real-time and on-line monitoring the cell growth and concentration in a dynamic cell culture environment, with techniques that suppressing noise from ambient light, non-uniform scattering distribution, bubble and interface reflection effects in the dynamic environment.
Quick Actions:
Peng, Hong. (2008). Apparatus and method for monitoring biological cell culture (U.S. Patent No. 7339671). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7339671
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