The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2008

Filed:

Nov. 07, 2005
Applicants:

Hans Matthiessen, Bad Schwartau, DE;

Gerd Peter, Lübeck, DE;

Axel Lamprecht, Lübeck, DE;

Inventors:

Hans Matthiessen, Bad Schwartau, DE;

Gerd Peter, Lübeck, DE;

Axel Lamprecht, Lübeck, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A device for the analysis of the qualitative, optionally also the quantitative composition of gases, uses measuring light of known spectral composition that can pass through the gas to be analyzed and the gas can be caused to interact. A detector arrangement is present, which can detect light originating from the sites of the interaction between the measuring light and the gas to be analyzed. At least one refractive-diffractive optical element is provided, which is transparent over its entire surface and contributes to a wavelength-dependent imaging of the light to be detected onto the detector arrangement in a transmitting manner. The refractive-diffractive optical element is arranged in the ray path between the area in which the interaction between the gas to be analyzed and the measuring light takes place and the detector arrangement.


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