The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2008

Filed:

May. 02, 2006
Applicants:

Mark Joseph Woodward, Santa Rosa, CA (US);

Marlin Viss, Santa Rosa, CA (US);

Inventors:

Mark Joseph Woodward, Santa Rosa, CA (US);

Marlin Viss, Santa Rosa, CA (US);

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A signal sampling system includes an input signal and a plurality of samplers. The plurality of samplers produces a plurality of sample output signals. Each sampler from the plurality of samplers samples the input signal to produce a corresponding sample output signal from the plurality of sample output signals. Each sampler samples the input signal with a sampling pulse having a sampling aperture. A first sampling aperture used by a first sampler from the plurality of samplers to sample the input signal differs in duration from a second sampling aperture used by a second sampler from the plurality of samplers to sample the input signal.


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