The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2008

Filed:

Dec. 09, 2005
Applicants:

Lawrence B. Reimer, Janesville, WI (US);

Daniel Russell Reneau, Madison, WI (US);

Inventors:

Lawrence B. Reimer, Janesville, WI (US);

Daniel Russell Reneau, Madison, WI (US);

Assignee:

Bourns, Inc., Riverside, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 7/30 (2006.01); G01R 33/09 (2006.01);
U.S. Cl.
CPC ...
Abstract

A sensor having a first array of N magnetic pole pairs, where N is a positive number, and a second array of M magnetic pole pairs, arranged substantially in parallel to the first array, where M is a positive number different from N, such as N−1 or N+1. A first magnetic pole in the second array is aligned with a first magnetic pole in the first array. The remaining magnetic poles in the second array are arranged such that each one of them is positioned with respect to at least one pole in the first array to form a magnetic field with an angular orientation with respect to the two poles. This arrangement of magnetic pole pairs can be used to measure absolute position. A third array of M magnetic pole pairs may be arranged substantially in parallel with the second array. The second and third arrays of magnetic pole pairs may be used to measure relative position between the two arrays.


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