The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2008

Filed:

Mar. 25, 2004
Applicants:

Makoto Iwashima, Yokosuka, JP;

Tetsuya Niikuni, Yokosuka, JP;

Inventors:

Makoto Iwashima, Yokosuka, JP;

Tetsuya Niikuni, Yokosuka, JP;

Assignee:

Nissan Motor Co., Ltd., Kanagawa-Ken, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H02J 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A malfunction detection circuit that detects a cell malfunction alternately outputs the results of an overcharge detection executed during an overcharge detection period and the results of an over-discharge detection executed during an over-discharge detection period through time sharing based upon a clock signal. When the cell is in the normal range, the signal level of the signal output during the overcharge detection period is different from the signal level of the signal output during the over-discharge detection period. Thus, in the malfunction detection, the signal generated when an overcharge malfunction has occurred in the cell can be distinguished from the signal generated when an over-discharge malfunction has occurred in the cell.


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