The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2008
Filed:
Oct. 09, 2003
Yoshihiro Kawano, Hicksville, NY (US);
Kiyoshi Koike, Hicksville, NY (US);
Yoshihiro Kawano, Hicksville, NY (US);
Kiyoshi Koike, Hicksville, NY (US);
Olympus America Inc., Center Valley, PA (US);
Abstract
A scanning optical microscope including: a light source; a lens for altering the cross-sectional shape aspect ratio of a beam of light emitted from the light source; at least one lens for converging beams of light of different cross-sectional shape aspect ratio to create a linear light; a first light modulation member able to impart shade to the converged linear light; a lens that can form the light to which the shade has been imparted as a parallel light; a scanning member that can alter the angle of illumination; a lens for focusing the light to which the shade has been imparted; an objective lens for projecting the light to which the shading has been imparted to a sample body; and a lens for imaging the reflected light from the sample body or the light generated by the sample body on to a sensor.