The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2008

Filed:

Oct. 29, 2003
Applicants:

Peter Aage Frischauf, Brøndby, DK;

Eiler Larsen, Brøndby, DK;

Inventors:

Peter Aage Frischauf, Brøndby, DK;

Eiler Larsen, Brøndby, DK;

Assignee:

Radiometer Medical ApS, Brønshøj, DK;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of performing calibration and quality control of a sensor for determining a parameter in a test fluid in which method a calibration and quality control cycle is repeated. A cycle includes the steps of performing a calibration and a quality control of the sensor using independent reference materials. In the method a reference material is in one cycle used in the quality control step which in a previous cycle was used in the calibration step. The present invention further provides an apparatus for performing the method.


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