The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2008

Filed:

Jan. 28, 2002
Applicants:

Manfred Dick, Gefell, DE;

Eckhard Schroeder, Eckental, DE;

Holger Maeusezahl, Jena, DE;

Inventors:

Manfred Dick, Gefell, DE;

Eckhard Schroeder, Eckental, DE;

Holger Maeusezahl, Jena, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A device for the subjective determination of aberrations of higher orders Xi in an optical system, in particular in an eye includes at least one observation channel into which defined plates can be introduced, the individual plates having optically active structures which correspond to a defined Zernike polynomial and to a defined amplitude, at least one order Xi of the Zemike polynomial being greater than two.


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