The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2008

Filed:

Sep. 09, 2005
Applicant:

Alysia M. Sagi-dolev, Palo Alto, CA (US);

Inventor:

Alysia M. Sagi-Dolev, Palo Alto, CA (US);

Assignee:

Qylur Security Systems, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for efficiently screening for dangerous threatening items are presented. The system includes an object unit designed to hold the object and a test unit including equipment for subjecting the object to a combination of two or more tests. There are sensors located in the object unit, wherein each of the sensors reads data resulting from testing the object and generates an output signal. A computation unit receives the output signal from each of the sensors and processes the output signals in parallel to determine a risk factor based on parameters resulting from the two or more tests. The parallel acquisition and processing of the output signals enhances accuracy. By testing a 'batch' of objects at once, the system improves throughput.


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