The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7337090 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 26, 2008

Filed:

Jul. 27, 2006
Applicants:

Yechiam Yemini, Cos Cob, CT (US);

Shaula Alexander Yemini, Briarcliff Manor, NY (US);

Shmuel Kliger, Chappaqua, NY (US);

Inventors:

Yechiam Yemini, Cos Cob, CT (US);

Shaula Alexander Yemini, Briarcliff Manor, NY (US);

Shmuel Kliger, Chappaqua, NY (US);

Assignee:

EMC Corporation, Hopkinton, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A computer implemented method and apparatus for determining the source of at least one observed event occurring among a plurality of types of components is disclosed. The method, operable on a computer system, utilizes a data structure produced for determining the source of a problem by mapping a plurality of observed events and a plurality of known causing events, wherein the mapping represents a correlation between the observed events and the causing events, determines a distance measure based on mapped correlation values and determines at least one causing event based on a distance measure within a known tolerance above a minimum distance measure.


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