The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2008
Filed:
Mar. 10, 2005
Koji Shimada, Fukuchiyama, JP;
Masahiro Kawachi, Kyotanabe, JP;
Koji Shimada, Fukuchiyama, JP;
Masahiro Kawachi, Kyotanabe, JP;
Omron Corporation, Kyoto-Shi, JP;
Abstract
A measurement instrument includes a measurement value acquiring portion for acquiring a measurement value in a predetermined period, and a measurement timing acquiring portion for acquiring measurement timing information. The measurement timing information is a measurement start timing, and the measurement timing information is added to the measurement value acquired in a predetermined period, corresponding to elapsed timing information which is calculated from the measurement period, based on the measurement start timing. In addition, a plurality of the measurement values added by the measurement timing information are digitally outputted collectively. In addition, an identification number of an applicable measurement instrument which number is owned by the measurement instrument is further added to the measurement value.