The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2008
Filed:
Jul. 07, 2003
Jin-bae Park, Tanhyeon-dong, Ilsan-gu, Goyang-si, Gyeonggi-do 411-320, KR;
Yong-june Shin, Yeouido-dong, Yeongdeungpo-gu, Seoul 150-010, KR;
Jong-gwan Yook, Seoul, KR;
Edward J. Powers, Austin, TX (US);
Eun-seok Song, Seoul, KR;
Joo-won Kim, Seoul, KR;
Tok-son Choe, Chungcheongbuk-do, KR;
Seung-hoon Sung, Seoul, KR;
Jin-Bae Park, Tanhyeon-dong, Ilsan-gu, Goyang-si, Gyeonggi-do 411-320, KR;
Yong-June Shin, Yeouido-dong, Yeongdeungpo-gu, Seoul 150-010, KR;
Jong-Gwan Yook, Seoul, KR;
Edward J. Powers, Austin, TX (US);
Eun-Seok Song, Seoul, KR;
Joo-Won Kim, Seoul, KR;
Tok-Son Choe, Chungcheongbuk-do, KR;
Seung-Hoon Sung, Seoul, KR;
Other;
Abstract
An apparatus and method for high-resolution reflectometry that operates simultaneously in both the time and frequency domains, utilizing time-frequency signal analysis and a chirp signal multiplied by a Gaussian time envelope. The Gaussian envelope provides time localization, while the chirp allows one to excite the system under test with a swept sinewave covering a frequency band of interest. High resolution in detection of the reflected signal is provided by a time-frequency cross correlation function. The high-accuracy localization of faults in a wire/cable can be achieved by measurement of time delay offset obtained from the frequency offset of the reflected signal. The apparatus enables one to execute an automated diagnostic procedure of a wire/cable under test by control of peripheral devices.