The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2008

Filed:

Jun. 08, 2004
Applicant:

Shuqi Chen, Brookline, MA (US);

Inventor:

Shuqi Chen, Brookline, MA (US);

Assignee:

Chen & Chen, LLC, Framingham, MA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12M 1/00 (2006.01); G01N 33/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A sample testing system may include a housing, a cavity in the housing to receive a chamber, two contact members, and a sensor. The contact members may be positioned to be engageable with respective portions of the chamber inserted in the cavity, and to compress those respective portions, thereby driving fluid flow. A sample testing system may include a housing, a cavity in the housing to receive a chamber, at least one contact member, and a sensor. The at least one contact member may be positioned to be engageable with a first segment of the chamber when the chamber is in the cavity, and to compress the first segment, thereby defining a gap of the first segment of the chamber and a reservoir in at least a second segment of the chamber.


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