The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2008
Filed:
Apr. 03, 2003
Roy S. Chuck, Irvine, CA (US);
Peter J. Mcdonnell, Irvine, CA (US);
Ramez Emile Necola Shehada, La Mirada, CA (US);
Roy S. Chuck, Irvine, CA (US);
Peter J. McDonnell, Irvine, CA (US);
Ramez Emile Necola Shehada, La Mirada, CA (US);
The Regents of the University of California, Oakland, CA (US);
Abstract
Methods and systems for determination of one or more substances within a material are described. A flow of fluorescence-exciting/ablative energy (e.g., laser pulse(s), preferably in the ultraviolet region (e.g. 193-nm)), is directed onto the material to ablate a thin layer of the material using photochemical decomposition. Simultaneously, the laser energy induces fluorescence of the substance(s) within the ablated layer of the material. The fluorescence emitted by the substance(s) is then received by a device, which measures the spectrum of the received fluorescence. The fluorescence spectra are then transmitted to a spectral processing device adapted to determine, on the basis of the fluorescence spectra, whether the substance(s) of interest is/are present in the material and/or the concentration at which the substance(s) of interest is/are present in the material. This process may be repeated for each layer of the material to determine the concentration gradient of the substance(s) of interest in the material.