The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2008

Filed:

Apr. 29, 2004
Applicants:

Christophe J Dorrer, Matawan, NJ (US);

Xiang Liu, Marlboro, NJ (US);

Inventors:

Christophe J Dorrer, Matawan, NJ (US);

Xiang Liu, Marlboro, NJ (US);

Assignee:

Lucent Technologies Inc., Murray Hill, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 27/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for monitoring PSK optical signals by measuring the RF spectrum of the signal and determining the power spectral density of noise on the optical signal within a predetermined frequency range to determine a measure of the degradation of the optical signal.


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