The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2008
Filed:
Nov. 27, 2002
Sang-oak Woo, Kyungki-do, KR;
Seok-yoon Jung, Seoul, KR;
Euee-seon Jang, Seoul, KR;
Mahn-jin Han, Kyungki-do, KR;
Do-kyoon Kim, Kyungki-do, KR;
Shin-jun Lee, Seoul, KR;
Gyeong-ja Jang, Kyungki-do, KR;
Sang-oak Woo, Kyungki-do, KR;
Seok-yoon Jung, Seoul, KR;
Euee-seon Jang, Seoul, KR;
Mahn-jin Han, Kyungki-do, KR;
Do-kyoon Kim, Kyungki-do, KR;
Shin-jun Lee, Seoul, KR;
Gyeong-ja Jang, Kyungki-do, KR;
Samsung Electronics Co., Ltd., Suwon, Kyungki-Do, KR;
Abstract
A DPCM operation which can reduce the size of differential data and a method and an apparatus for encoding data using the DPCM operation are provided. A method for generating differential data includes generating differential data by performing a DPCM operation on quantized data and generating predicted differential data by performing a predicted DPCM operation on the quantized data, generating circular-quantized differential data and circular-quantized predicted differential data by performing a circular quantization operation on the differential data and the predicted differential data so as to reduce their ranges, and selecting one of the circular-quantized differential data and the circular-quantized predicted differential data depending on their magnitudes.