The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2008
Filed:
Feb. 13, 2006
Kazuhiko Oka, Sapporo, JP;
Tomohiro Mizuno, Sapporo, JP;
Atsushi Taniguchi, Sapporo, JP;
Hiroshi Okabe, Kyoto, JP;
Kazuhiko Oka, Sapporo, JP;
Tomohiro Mizuno, Sapporo, JP;
Atsushi Taniguchi, Sapporo, JP;
Hiroshi Okabe, Kyoto, JP;
National University Corporation Hokkaido University, Sapporo-Shi, JP;
Omron Corporation, Kyoto-Shi, JP;
Abstract
To effectively reduce a measurement error in a parameter indicating two-dimensional spatial distribution of a state of polarization generated by variations in retardation of a birefringent prism pair due to a temperature change or other factors, while holding a variety of properties of an imaging polarimetry using the birefringent prism pair. By noting that reference phase functions φ(x, y) and φ(x, y) are obtained by solving an equation from each vibration component contained in an intensity distribution I(x, y), the reference phase functions φ(x, y) and φ(x, y) are calibrated concurrently with measurement of two-dimensional spatial distribution S(x, y), S(x, y), S(x, y), and S(x, y) of Stokes parameters.