The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2008
Filed:
Feb. 24, 2004
Alan M. Ganz, Scarsdale, NY (US);
Henry C. Weber, Scarsdale, NY (US);
Alan M. Ganz, Scarsdale, NY (US);
Henry C. Weber, Scarsdale, NY (US);
August Ninth Analyses, Inc., Scarsdale, NY (US);
Abstract
Method and apparatus for evaluating one or more materials in accordance with size of particles. The method includes evaluating a spectrum of light reflected from a first group of particles; evaluating a spectrum of light reflected from a second group of particle; comparing results of said evaluating of said first group with results of said evaluating of said second group; and providing an indication of a state of said material when said comparing produces a predetermined comparison result. Distance between a first light conductor for conducting light to the particles and a second light conductor for conducting light from said particles for said evaluations may be varied. Monitoring of a process for changes in particle size as a function of time or to determine various physical and/or chemical characteristics of the particles or a mixture containing same, including homogeneity, may be achieved.