The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2008
Filed:
Sep. 20, 2005
Michael Voelker, Immenstaad, DE;
Michael Voelker, Immenstaad, DE;
Eads Astrium GmbH, Munich, DE;
Abstract
In a method for interferometric radar measurement, at least two side looking RADAR systems on satellite and/or missile-supported platforms illuminate a common surface area by means of microwave signals. A first side looking RADAR system sends a first radar signal on a first transmit frequency, and at least a second side looking RADAR system sends at least a second radar signal on at least a second transmit frequency. At least one of the at least two side looking RADAR systems receives the at least two interfering radar signals reflected on the common surface area, determines difference phases of the received radar signals from the interferograms, determines therefrom a drift of a system clock of the at least two side looking RADAR systems, and compensates the determined drift.