The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2008
Filed:
Jun. 02, 2006
Victor Verbinski, La Jolla, CA (US);
Dan Madson, Murrieta, CA (US);
Victor Verbinski, La Jolla, CA (US);
Dan Madson, Murrieta, CA (US);
Science Applications International Corporation, San Diego, CA (US);
Abstract
Described herein is system for the inspection of a target object. The system may include a gamma radiation source, a gamma detector and an image processor coupled to the gamma detector. When the inspection system is operating in a first active mode for imaging a target object, the gamma radiation source directs radiation at a target object, the radiation passes through the target object, and the image processor images the target object based on an output of the gamma detector. When the dual-mode system is operating in a second passive mode for imaging a target object, the target object is scanned by a neutron detector for radiation that is emitted by the target object, the emitted radiation from the target object is detected by the neutron detector and an indicator indicates the presence of the emitted radiation.