The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2008
Filed:
Mar. 16, 2005
Applicants:
R. Malcolm Brown, Jr., Austin, TX (US);
Zack Barnes, Austin, TX (US);
Chie Sawatari, Shizuoka, JP;
Tetsuo Kondo, Kukuoka, JP;
Inventors:
R. Malcolm Brown, Jr., Austin, TX (US);
Zack Barnes, Austin, TX (US);
Chie Sawatari, Shizuoka, JP;
Tetsuo Kondo, Kukuoka, JP;
Assignee:
Board of Regents, The University of Texas System, Austin, TX (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention includes a method, apparatus and system for nanofabrication in which one or more target molecules are identified for manipulation with an electron beam and the one or more target molecules are manipulated with the electron beam to produce new useful materials.
Brown, Jr., R.. (2008). High resolution low dose transmission electron microscopy real-time imaging and manipulation of nano-scale objects in the electron beam (U.S. Patent No. 7335882). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7335882
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile