The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2008
Filed:
Nov. 17, 2005
Applicants:
Eckhard Langer, Radebeul, DE;
Moritz-andreas Meyer, Dresden, DE;
Inventors:
Eckhard Langer, Radebeul, DE;
Moritz-Andreas Meyer, Dresden, DE;
Assignee:
Advanced Micro Devices, Inc., Austin, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 37/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention provides a technique for estimating critical dimensions of highly scaled circuit features on the basis of scanning electron microscopy, wherein area fractions of a scan area are determined. Preferably, the SEM is operated with high electron beam energies to enhance the overall resolution and to reduce edge effects and image artifacts. Thus, fast and statistically significant measurement results may be obtained, thereby allowing enhanced process control.