The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2008
Filed:
Dec. 30, 2005
Applicants:
YE Han, San Jose, CA (US);
Yuzhong Wang, Palo Alto, CA (US);
Wenjing Yang, Sunnyvale, CA (US);
Inventors:
Assignee:
Metara, Inc., Sunnyvale, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/04 (2006.01);
U.S. Cl.
CPC ...
Abstract
An apparatus and method for improved inline and automated chemical analysis is provided, in particular disclosing signal optimization for an electrospray ionization mass spectrometer apparatus. A substantially inert pathway for ion analysis is provided by using substantially inert metals or polymers for pathway parts. Other enhancements and advantages are also disclosed, including an advantageous probe profile and metal foil cover.