The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2008

Filed:

Oct. 16, 2006
Applicants:

Andreas Rose, San Macros, CA (US);

Guenter Herr, Ehringshausen, DE;

Kyle Johnston, Sammamish, WA (US);

Inventors:

Andreas Rose, San Macros, CA (US);

Guenter Herr, Ehringshausen, DE;

Kyle Johnston, Sammamish, WA (US);

Assignee:

Ondine International Ltd, St. Michael, BB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 6/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides an alignment system comprising a base having a feature that accepts a first optical element, a first eccentric element having a through hole that accepts an eccentric assembly comprising a second eccentric element having a feature that accepts a second optical element and is attached to the second optical element via second attachment means, wherein the first eccentric element is engaged with the base via first attachment means and axial alignment between optical axis of the first optical element and optical axis of the second optical element is achieved by rotationally adjusting at least one of the eccentric elements relative to the base. The present invention also provides methods to make and use this alignment system.


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