The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2008
Filed:
Jan. 06, 2005
Applicant:
Masatake Nukui, Tokyo, JP;
Inventor:
Masatake Nukui, Tokyo, JP;
Assignee:
GE Medical Systems Global Technology Company, LLC, Waukesha, WI (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for correcting scatter in multi-slice imaging wherein, a projection p and a scatter correction factor R(d, do) are stored in association with each other, a projection p is determined from data Dcollected by imaging a subject with an X-ray beam with a beam thickness d using a detector with a detector thickness do, the scatter correction factor R(d, do) associated with the projection p is determined, and the data Dis multiplied by the scatter correction factor R(d, do) to obtain scatter-corrected data D