The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2008
Filed:
Dec. 22, 2003
Nobuyuki Nakamura, Nara, JP;
Nobuyuki Nakamura, Nara, JP;
Sharp Kabushiki Kaisha, Osaka, JP;
Abstract
In second transport means (), nipping pressure of each of outermost star wheels (), () located at opposite ends in the primary scanning direction is set higher than that of each of star wheels () to () within a range lower than nipping pressure of first transport means. If a leading edge of a recording medium () is in a downwardly deformed state when reaching the second transport means (), such deformation acts to press the wheels () to () upwardly. However, the nipping pressure of each of the opposite end star wheels (), () nipping angular portions of the medium () on the leading edge side is set high enough to rectify such deformation at the angular portions. Accordingly, the medium () is nipped between a second driving roller () and the wheels () to () with its deformed angular portions rectified, and hence is transported in an ideal condition.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile