The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2008
Filed:
May. 09, 2006
Ami Chand, Goleta, CA (US);
Kevin J. Kjoller, Santa Barbara, CA (US);
Kenneth L. Babcock, Santa Barbara, CA (US);
Michael K. Harris, Santa Barbara, CA (US);
Ami Chand, Goleta, CA (US);
Kevin J. Kjoller, Santa Barbara, CA (US);
Kenneth L. Babcock, Santa Barbara, CA (US);
Michael K. Harris, Santa Barbara, CA (US);
Veeco Instruments, Inc., Woodbury, NY (US);
Abstract
A method and apparatus for manipulating the surface of a sample including a cantilever, a first tip mounted on the cantilever, and a second tip mounted on the cantilever, the first and the second tip being configured to combine to form an imaging probe and to separate to form a manipulation probe. The first and second tips are configured to form a first position characterized in that the tips combine to form an imaging tip and the first and the second tip are configured to form a second position characterized in that the tips separate to manipulate particles on a surface of a sample. The tips can be configured to form the first position when a voltage is applied across the tips, and preferable extend downwardly from the cantilever substantially perpendicular thereto.