The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2008

Filed:

May. 20, 2005
Applicant:

Eric Fauveau, Baton Rouge, LA (US);

Inventor:

Eric Fauveau, Baton Rouge, LA (US);

Assignee:

K-Tek Corporation, Prairieville, LA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention is a method to detect a weak interface signal in a guided wave level measurement device. The device includes a waveguide, a signal generator and a signal receiver, the signal generator and signal receiver being operationally connected to the waveguide. The method includes the steps of transmitting an outgoing signal; monitoring the signal received at the signal receiver to detect a first signal level that exceeds or equals a first threshold level (TH) and if such a signal level is detected, continue monitoring the received signal to detect a second signal level that exceeds or equals TH. Finally, if a second signal level in excess of THis detected, continue monitoring the received signal to detect a third signal level that exceeds or equals a second threshold level TH


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