The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 19, 2008

Filed:

Aug. 16, 2004
Applicants:

Yan Zhang, Cupertino, CA (US);

Paul Yang LU, Los Altos, CA (US);

Yue Chen, Fremont, CA (US);

Inventors:

Yan Zhang, Cupertino, CA (US);

Paul Yang Lu, Los Altos, CA (US);

Yue Chen, Fremont, CA (US);

Assignee:

Broadcom Corporation, Irvine, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/42 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for ensuring data integrity in a data processing system may comprise monitoring when data for a specified device is available for error correction code generation, and receiving a first indication of the specified device, a second indication of the data, and a third indication of a size of the data during the monitoring. A new error correction code may be generated in hardware for the data based on the indicated size of the data and an indication may be provided to signal when generation of the new error correction code for a specified number of accesses for at least a portion of the data is complete. Detected errors may be corrected in software based on the newly generated error correction code. The first indication may be a device selection signal and the error correction code generation may be enabled or disabled via an enable signal.


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