The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2008
Filed:
Aug. 11, 2006
Akihito Yamane, Osaka, JP;
Akihito Yamane, Osaka, JP;
Sumitomo Metal Industries, Ltd., Osaka, JP;
Abstract
A complex Fourier transform is performed on measured values of wall thickness at points in a cross section of a pipe in an axial direction, types of thickness deviation are classified, thickness deviation amount is calculated from the absolute value of the complex Fourier component, the position of a thick or thin portion of thickness deviation is calculated from the phase of the complex Fourier component, and manufacturing conditions of the pipe are adjusted based on these variables. The relationship r·exp(jθ) between the thickness deviation amount r and phase θ of a first-order thickness deviation obtained for cross sections in the axial direction is subjected to a complex Fourier transform as a function of pipe longitudinal direction, the thickness deviation is further classified by the frequency of twist of the thickness deviation, and an action is taken to prevent the thickness deviation according to the classified thickness deviation.