The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2008
Filed:
Mar. 19, 2003
Stephen David Hayward, Malvern, GB;
Timothy Ingram Cox, Malvern, GB;
Marie Harper Anderson, Malvern, GB;
Stephen David Hayward, Malvern, GB;
Timothy Ingram Cox, Malvern, GB;
Marie Harper Anderson, Malvern, GB;
Qinetiq Limited, , GB;
Abstract
A method for detecting perturbation of a physical system from a reference state associated with a reference parameter (ω) to a perturbed state associated with a perturbed parameter (ω) includes firstly deriving the reference parameter (ω). A reference vector (F) is then derived which describes the system's state at the reference parameter (ω). A measurement-related vector (Z) associated with a perturbed state of the system is then subtracted from the reference vector (F) to provide an error vector (E). The error vector members are summed and normalised by division of a summation of elements of a vector (F') representing a derivative (f(ωδω)) of a reference itself represented by the reference vector (F), the derivative (f(ωδω)) being evaluated at the reference parameter (ω). This provides a result equal to the difference (ω−(ω) between the perturbed parameter (ω) and the reference parameter (ω).