The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2008
Filed:
Jun. 27, 2005
Emad Andarawis Andarawis, Ballston Lake, NY (US);
Mahadevan Balasubramaniam, Clifton Park, NY (US);
Todd Alan Anderson, Niskayuna, NY (US);
Samhita Dasgupta, Niskayuna, NY (US);
David Mulford Shaddock, Troy, NY (US);
Shobhana Mani, Clifton Park, NY (US);
Jie Jiang, Schenectady, NY (US);
Emad Andarawis Andarawis, Ballston Lake, NY (US);
Mahadevan Balasubramaniam, Clifton Park, NY (US);
Todd Alan Anderson, Niskayuna, NY (US);
Samhita Dasgupta, Niskayuna, NY (US);
David Mulford Shaddock, Troy, NY (US);
Shobhana Mani, Clifton Park, NY (US);
Jie Jiang, Schenectady, NY (US);
General Electric Company, Niskayuna, NY (US);
Abstract
A clearance measurement system is provided. The clearance measurement system includes a reference geometry disposed on a first object having an otherwise continuous surface geometry and a sensor disposed on a second object, wherein the sensor is configured to generate a first signal representative of a first sensed parameter from the first object and a second signal representative of a second sensed parameter from the reference geometry. The clearance measurement system also includes a processing unit configured to process the first and second signals to estimate a clearance between the first and second objects based upon a measurement difference between the first and second sensed parameters.