The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2008
Filed:
Oct. 25, 2001
Takefumi Nagata, Kaisei-machi, JP;
Kazuo Shimura, Kaisei-machi, JP;
Takeshi Ohkubo, Kaisei-machi, JP;
Takefumi Nagata, Kaisei-machi, JP;
Kazuo Shimura, Kaisei-machi, JP;
Takeshi Ohkubo, Kaisei-machi, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
An measurement processing apparatus for efficiently measuring geometric data of an image is provided. A reference-image outputting means forms a reference-image based on an image that has been previously measured as well as a setting order data which indicates a suggestion as to the order in which the measuring points should be set and which shows the same setting order in which the measuring points were set for a previously performed measurement of a past-measurement image, and outputs the reference-image and the setting order data to an image display means. While consulting the reference-image and the setting order data displayed on the image display means, an operator can set, by use of a measuring point setting means, the measuring points at the correct positions and in the correct order in the subject image displayed on a display screen, and the geometrical data can be measured automatically and efficiently.