The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2008
Filed:
Aug. 13, 2003
Masanori Hara, Tokyo, JP;
Hiroaki Toyama, Tokyo, JP;
Masanori Hara, Tokyo, JP;
Hiroaki Toyama, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
A streaked pattern image analyzing apparatus for use in an analysis of a fingerprint and the like for aiding in the identification as to whether or not an applied first streaked pattern image matches a second streaked pattern image. The apparatus comprises an image distortion modification unit for modifying data on one of the first streaked pattern image and the second streaked pattern image such that a point on a first streaked pattern image which resides on a skeleton thinned from a streak of the streaked pattern image and having a corresponding point on the second streaked pattern image is brought closer to a point on a skeleton of the second streaked pattern image corresponding to the point, and an image display unit for displaying the streaked pattern image modified by the image distortion modifying unit and the other streaked pattern image.