The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2008
Filed:
Oct. 14, 2005
Chien Chou, Taipei City, TW;
Yi-shin Chan, Taipei, TW;
Jheng-syong Wu, Miao-Li Hsien, TW;
Li-ping Yu, Taipei, TW;
Chien Chou, Taipei City, TW;
Yi-Shin Chan, Taipei, TW;
Jheng-Syong Wu, Miao-Li Hsien, TW;
Li-Ping Yu, Taipei, TW;
Other;
Abstract
In a method for measuring an absorption coefficient and a reduced scattering coefficient of a multiple scattering medium, a source light beam is outputted, and is transformed into a transformed light beam that includes a mutually parallel circularly polarized photon pair. The transformed light beam is split into a signal beam, which is focused and projected into the multiple scattering medium to produce a diffused polarized photon pair density wave, and a reference beam, which is converted into a reference heterodyne interference signal. The diffused polarized photon pair density wave is converted into a test heterodyne interference signal. Amplitude attenuation and phase delay of the signal beam that has propagated through the multiple scattering medium is obtained based on the reference and test heterodyne interference signals, from which the absorption coefficient and the reduced scattering coefficient of the multiple scattering medium are inferred.