The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2008
Filed:
Mar. 14, 2003
Applicants:
Neville John Freeman, Utkinton, GB;
Graham Cross, Stockton-on-Tees, GB;
Gerard Anthony Ronan, Salford, GB;
Inventors:
Neville John Freeman, Utkinton, GB;
Graham Cross, Stockton-on-Tees, GB;
Gerard Anthony Ronan, Salford, GB;
Assignee:
Farfield Sensors Limited, Wythenshawe, Manchester, GB;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G02B 6/00 (2006.01); B32B 5/02 (2006.01); B32B 27/04 (2006.01); B32B 27/12 (2006.01); G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention relates to a method for determining a qualitative characteristic of an interferometric component (eg a planar waveguide structure) or a process for determining a qualitative characteristic of a stimulus of interest to which the interferometric component (eg the planar waveguide structure) has been exposed by measuring a non-positional characteristic of the interference fringes.