The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2008
Filed:
Apr. 07, 2005
Roy Clark, Thousand Oaks, CA (US);
Roy Clark, Thousand Oaks, CA (US);
The Bowing Company, Chicago, IL (US);
Abstract
In accordance with an embodiment of the present invention, an apparatus for measuring light scatter loss from a test piece includes a light source, an optical cavity including the test piece and at least one mirror located along a path, and a light detector. The cavity receives an input beam from the light source, circulates a beam within the cavity as a circulating beam, and produces an output beam. Irregularities on the surface of the test piece result in a progressive diffusion of the circulating beam about the path. The light detector provides an output signal based on the intensity of the output beam. The output signal has an initial slope that determines a first saturation value. The output signal has a second saturation value. The difference between the first saturation value and the second saturation value provides a scatter loss measurement.