The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2008
Filed:
Jan. 17, 2003
Stephen F. Fulghum, Jr., Marblehead, MA (US);
Koichi Furusawa, Wellesley, MA (US);
Kohei Iketani, Kawagoe, JP;
Stephen F. Fulghum, Jr., Marblehead, MA (US);
Koichi Furusawa, Wellesley, MA (US);
Kohei Iketani, Kawagoe, JP;
Pentax Corporation, Tokyo, JP;
Newton Laboratories, Inc., Belmont, MA (US);
Abstract
The present invention provides systems and methods for the determination of the physical characteristics of a structured superficial layer of material using light scattering spectroscopy. The light scattering spectroscopy system comprises optical probes that can be used with existing endoscopes without modification to the endoscope itself. The system uses a combination of optical and computational methods to detect physical characteristics such as the size distribution of cell nuclei in epithelial layers of organs. The light scattering spectroscopy system can be used alone, or in conjunction with other techniques, such as fluorescence spectroscopy and reflected light spectroscopy.