The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2008
Filed:
Jan. 25, 2006
Makoto Nakagawa, Hiroshima, JP;
Hideyuki Okada, Hiroshima, JP;
Michihide Fujiwara, Hiroshima, JP;
Noriaki Mizutani, Nagano, JP;
Makoto Nakagawa, Hiroshima, JP;
Hideyuki Okada, Hiroshima, JP;
Michihide Fujiwara, Hiroshima, JP;
Noriaki Mizutani, Nagano, JP;
Mazda Motor Corporation, Hiroshima, JP;
Circuit Design, Inc., Nagano, JP;
Abstract
In a periphery monitoring system for monitoring movements of a mobile object around an installation location of a Doppler sensor, a signal output from the Doppler sensor is subjected to an FFT analysis, and a total sum of the frequency levels of all of the frequency bands obtained through the FFT analysis is calculated at predetermined time intervals. A reference level and abnormal level are set based on the calculated total sum. If the calculated total sum exceeds the abnormal level and falls to or below the abnormal level before a first set period passes since the exceeding of the abnormal level, the periphery status is determined to be abnormal. If the total sum exceeds the abnormal level but does not fall to or below the abnormal level even after the first set period passes since the exceeding of the abnormal level, the periphery status is determined to be normal, and the reference level is updated to a new reference level set based on total sums calculated during the first set period.