The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2008
Filed:
Mar. 14, 2006
Applicant:
Yusuke Matsushima, Tokyo, JP;
Inventor:
Yusuke Matsushima, Tokyo, JP;
Assignee:
NEC Corporation, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
H03F 3/45 (2006.01);
U.S. Cl.
CPC ...
Abstract
An analog-differential-circuit test device includes transfer gatesandfor isolating in the test mode an input pair of an analog differential circuit from input nodes IN and INB, a voltage adjusting circuit for generating a voltage pair controlled by a control signal fed from outside of the LSI and input to the input pair during the test mode, and a flip-flop for latching an output from the analog differential circuit. A High-output input characteristic and a Low-output input characteristic of the analog differential circuit itself are measured in the LSI.