The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 19, 2008

Filed:

Feb. 21, 2006
Applicants:

Vi-hoa Tran, Newport News, VA (US);

Steven Richard Meikle, Penshurst, AU;

Mark Frederick Smith, Yorktown, VA (US);

Inventors:

Vi-Hoa Tran, Newport News, VA (US);

Steven Richard Meikle, Penshurst, AU;

Mark Frederick Smith, Yorktown, VA (US);

Assignee:

Jefferson Science Associates, LLC, Newport News, VA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/161 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for calibrating multi-headed high sensitivity and high spatial resolution dynamic imaging systems, especially those useful in the acquisition of tomographic images of small animals. The method of the present invention comprises: simultaneously calibrating two or more detectors to the same coordinate system; and functionally correcting for unwanted detector movement due to gantry flexing.


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